The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Jul. 06, 2010
Applicants:

David Sowards-emmerd, Sunnyvale, CA (US);

Charles Nortmann, Richmond Heights, OH (US);

Eberhard Hansis, Hamburg, DE;

Michael Grass, Buchholz in der Norheide, DE;

Inventors:

David Sowards-Emmerd, Sunnyvale, CA (US);

Charles Nortmann, Richmond Heights, OH (US);

Eberhard Hansis, Hamburg, DE;

Michael Grass, Buchholz in der Norheide, DE;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/006 (2013.01); G06T 2211/432 (2013.01);
Abstract

In accordance with one aspect of the invention a method and apparatus for generating complete scout scans with CT imaging devices having offset detector geometries is provided. In accordance with another aspect of the invention, a method and apparatus for increasing the reconstructable field of view for CT imaging devices having offset detector geometries is provided. In accordance with another aspect of the invention, a method and apparatus for image reconstruction for region of interest and full-body imaging with CT imaging devices having offset detector geometries is provided. In accordance with another aspect of the invention, a combined x-ray and SPECT imaging system is provided.


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