The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Jan. 06, 2010
Arman M. Garakani, Cambridge, MA (US);
Andrew A. Hack, Pride's Crossing, MA (US);
Peter Roberts, Dedham, MA (US);
Sean Walter, Needham, MA (US);
Arman M. Garakani, Cambridge, MA (US);
Andrew A. Hack, Pride's Crossing, MA (US);
Peter Roberts, Dedham, MA (US);
Sean Walter, Needham, MA (US);
Reify Corporation, Cambridge, MA (US);
Abstract
The present invention provides methods and apparatus for acquisition, compression, and characterization of spatiotemporal signals. In one aspect, the invention assesses self-similarity over the entire length of a spatiotemporal signal, as well as on a moving attention window, to provide cost effective measurement and quantification of dynamic processes. The invention also provides methods and apparatus for measuring self-similarity in spatiotemporal signals to characterize, adaptively control acquisition and/or storage, and assign meta-data for further detail processing. In some embodiments, the invention provides for an apparatus adapted for the characterization of biological units, and methods by which attributes of the biological units can be monitored in response to the addition or removal of manipulations, e.g., treatments. The attributes of biological units can be used to characterize the effects of the abovementioned manipulations or treatments as well as to identify genes or proteins responsible for, or contributing to, these effects.