The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Oct. 19, 2011
David Diller, Greenwood Village, CO (US);
Barry Fish, Arvada, CO (US);
Ran Xuan, Westminster, TX (US);
Charles John Sicking, Plano, TX (US);
David Diller, Greenwood Village, CO (US);
Barry Fish, Arvada, CO (US);
Ran Xuan, Westminster, TX (US);
Charles John Sicking, Plano, TX (US);
Global Microseismic Services, Inc., Missouri City, TX (US);
Abstract
Disclosed herein are various embodiments of methods and systems for determining the orientation and direction of first motion of a fault or fracture by optimizing an azimuthally-dependent attribute of signals generated by microseismic sources, comprising: recording microseismic data traces using a of sensors located at a plurality of sensor positions; subdividing the subsurface volume into spatial volumes corresponding to selected time intervals and comprising a plurality of voxels; for each voxel, applying a time shift to the microseismic data traces that is substantially equal to a travel time from each voxel to the corresponding sensor position, and determining for the voxel the orientation and direction of first motion of the fault or fracture corresponding to a maximum value for the voxel of at least one azimuthally-dependent attribute of the microseismic data traces.