The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Feb. 08, 2011
Katsumasa Fujita, Osaka, JP;
Shogo Kawano, Osaka, JP;
Masahito Yamanaka, Osaka, JP;
Satoshi Kawata, Osaka, JP;
Katsumasa Fujita, Osaka, JP;
Shogo Kawano, Osaka, JP;
Masahito Yamanaka, Osaka, JP;
Satoshi Kawata, Osaka, JP;
Osaka University, Osaka, JP;
Abstract
Provided is a microscope and an observation method which can improve spatial resolution. A microscope according to an aspect of the invention includes a laser light source (), an objective lens () that focuses light from the laser light source on a sample, and a detector () that detects the laser light as signal light from a sample () when the sample () is irradiated with the laser light. The light is applied to the sample with an intensity changed to obtain a nonlinear region where intensities of the light and the signal light have a nonlinear relation due to occurrence of saturation or nonlinear increase of the signal light when the light has a maximum intensity, and the detector () detects the signal light according to the intensity of the laser light to perform observation based on a saturation component or a nonlinear increase component of the signal light.