The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Oct. 17, 2012
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Ahmad Al-Dahle, Santa Clara, CA (US);

David A. Stronks, San Jose, CA (US);

Hopil Bae, Sunnyvale, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 3/36 (2006.01); G09G 5/10 (2006.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/3696 (2013.01); G09G 3/006 (2013.01); G09G 3/3655 (2013.01); G09G 2310/067 (2013.01); G09G 2320/0223 (2013.01); G09G 2320/0693 (2013.01); G09G 2360/145 (2013.01);
Abstract

Systems, methods, and devices for calibrating an electronic display to reduce or eliminate a mura artifact are provided. The mura artifact may be due to differential behavior of common voltage layers (VCOMs) in the electronic display. One method for reducing or eliminating the mura artifact may involve setting pixels of the electronic display to a first gray level and measuring a luminance difference between light and dark areas of a mura artifact on the electronic display. A value of an operating parameter of the electronic display may be adjusted while monitoring the luminance difference measurement. A value of the operating parameter that causes the luminance difference measurement to be within a specified range of acceptable luminance difference measurement values may be stored in the electronic display.


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