The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Aug. 17, 2011
Joshua G. Nickel, San Jose, CA (US);
Jerzy Guterman, Mountain View, CA (US);
Mattia Pascolini, San Mateo, CA (US);
Chun-lung Chen, Sunnyvale, CA (US);
Joss Nathan Giddings, San Francisco, CA (US);
Joshua G. Nickel, San Jose, CA (US);
Jerzy Guterman, Mountain View, CA (US);
Mattia Pascolini, San Mateo, CA (US);
Chun-Lung Chen, Sunnyvale, CA (US);
Joss Nathan Giddings, San Francisco, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Electronic device structures may be tested using a radio-frequency test system. The radio-frequency test system may include radio-frequency test equipment and an associated test fixture. The radio-frequency test equipment may be used in generating and measuring radio-frequency signals. The test fixture may contain adjustable structures that allow the positions of radio-frequency test probes to be adjusted. The test system may be configured to position radio-frequency probes in the test fixture so that some probe contacts form electrical connections with conductive antenna structures. The radio-frequency probes may contain other contacts that are positioned to form electrical connections with conductive electronic device housing structures. During radio-frequency testing, the test equipment in the test system may apply radio-frequency test signals to the device structures under test using the test probes. Corresponding radio-frequency test signals may be measured by the test equipment.