The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Sep. 26, 2012
Applicant:

Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, Guangdong, CN;

Inventors:

Songxian Wen, Shenzhen, CN;

Jungmao Tsai, Shenzhen, CN;

Shiue-shih Liao, Shenzhen, CN;

Yizhuang Zhuang, Shenzhen, CN;

Mingfeng Deng, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 31/28 (2006.01); H01L 23/58 (2006.01); G09G 3/36 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2851 (2013.01); H01L 23/58 (2013.01); H01L 2924/0002 (2013.01); G09G 3/36 (2013.01); G09G 2300/0426 (2013.01); G09G 3/3648 (2013.01);
Abstract

A TFT-LCD array substrate includes a display area, a peripheral area located at a periphery of the display area, and a connecting device. Wherein, the display area includes a plurality of data lines and gate lines. The peripheral area provides with a first test short bar provided with a plurality of data test lines for transmitting a test signal for the data lines, and a second test short bar provided with a gate test line for transmitting a test signal for the gate lines. The connecting device includes a first connection layer and a second connection layer. The connecting device is disposed at a connection location between one of the data test lines and one of the data lines, or between the gate test line and one of the gate lines. A test method for testing the TFT-LCD array substrate is also provided.


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