The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Dec. 09, 2010
Daniel W. Tam, San Diego, CA (US);
Randall A. Reeves, San Diego, CA (US);
John H. Meloling, San Diego, CA (US);
Daniel W. Tam, San Diego, CA (US);
Randall A. Reeves, San Diego, CA (US);
John H. Meloling, San Diego, CA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A method for estimating the characteristic impedance of a structure comprising the following steps: providing a current probe comprising a magnetic core having an aperture therein and a primary winding wrapped around the core; measuring, with a calibrated vector network analyzer (VNA), the impedance (Z) of the current probe while in an open configuration wherein nothing but air occupies the aperture and the current probe is isolated from a ground; measuring, with the VNA, the impedance (Z) of the current probe while in a short configuration, wherein the current probe is electrically shorted; measuring, with the VNA, the impedance (Z) of the current probe while the current probe is mounted to the structure such that the structure extends through the aperture; and calculating an estimated characteristic impedance (Z') of the structure according to the following equation: Z′=(Z−Z)(Z−Z)/(Z−Z).