The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Oct. 14, 2011
Applicants:
Antje Kickhefel, Erlangen, DE;
Joerg Roland, Hemhofen, DE;
Eva Rothgang, Nuremberg, DE;
Inventors:
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01); G01R 33/34 (2006.01); G01R 33/565 (2006.01); G01R 33/563 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4804 (2013.01); G01R 33/56308 (2013.01); G01R 33/56341 (2013.01); G01R 33/56509 (2013.01);
Abstract
In a magnetic resonance method and system to determine a position of a slice relative to a region moving relative to the slice within a predetermined volume segment of an examination subject located in the magnetic resonance system, a physical property within the slice is detected with spatial resolution at multiple points in time, such that a time curve of the physical property is detected for at least one voxel of the slice. The position of the slice relative to the region is determined with respect to defined points in time, depending on the time curve.