The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Dec. 30, 2013
Applicant:
Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, CN;
Inventors:
Peng Du, Shenzhen, CN;
Minghung Shih, Shenzhen, CN;
Assignee:
Shenzhen China Star Optoelectronics Technology Co Ltd, Shenzhen, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); H01L 27/12 (2006.01); H01L 21/66 (2006.01); H01L 27/105 (2006.01); H01L 23/48 (2006.01); H01L 23/00 (2006.01); H01L 27/32 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1244 (2013.01); H01L 22/22 (2013.01); H01L 22/32 (2013.01); H01L 27/105 (2013.01); H01L 23/481 (2013.01); H01L 24/48 (2013.01); H01L 27/3223 (2013.01); H01L 24/83 (2013.01); H01L 2251/568 (2013.01); H01L 2924/10 (2013.01); H01L 2224/83191 (2013.01); H01L 2224/48227 (2013.01); H01L 2224/73265 (2013.01);
Abstract
A display device and a testing line repairing method thereof is provided herein and the method comprises steps of: cutting off a connection between a first input end of a first thin film transistor (TFT), a first output end and a testing signal input line; and connecting a first dummy line and a testing signal output line by a laser welding method. The width-to-length ration in the display device of the present disclosure won't be varied and an abnormal display in the light-on testing won't happen.