The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Feb. 08, 2012
Applicants:

Satoshi Nakamura, Kodaira, JP;

Yuji Kurotani, Kodaira, JP;

Tatsuro Tanabe, Kodaira, JP;

Takaaki Igarashi, Kodaira, JP;

Inventors:

Satoshi Nakamura, Kodaira, JP;

Yuji Kurotani, Kodaira, JP;

Tatsuro Tanabe, Kodaira, JP;

Takaaki Igarashi, Kodaira, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 5/00 (2006.01); G01N 23/00 (2006.01); G01N 1/28 (2006.01); G01N 33/44 (2006.01);
U.S. Cl.
CPC ...
G01N 23/00 (2013.01); G01N 1/286 (2013.01); G01N 33/442 (2013.01);
Abstract

Provided is a method for evaluating a polymer material, wherein the state of dispersion of a filler in a polymer material can be quickly and quantitatively evaluated. The method for evaluating a polymer material which is a polymer material containing the polymer compound and the filler and of which at least an upper surface is a flat surface. The polymer materialis cut in a direction at an angle α of 1 to 60° with respect to the surface of the polymer material using a focused ion beam (FIB), and a smooth surfaceA of the polymer material, formed by the cutting, is then photographed in a direction perpendicular to the smooth surface.


Find Patent Forward Citations

Nakamura, Satoshi. (2015). Method for evaluating polymer material (U.S. Patent No. 9000367). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9000367

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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