The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Dec. 21, 2009
Applicant:

Benedict Deefholts, London, GB;

Inventor:

Benedict Deefholts, London, GB;

Assignee:

Buhler Sortex Ltd, London, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C 5/00 (2006.01); B07C 5/36 (2006.01); B07C 5/342 (2006.01); G01N 21/31 (2006.01); G01N 21/85 (2006.01); G01N 33/02 (2006.01); G01N 21/359 (2014.01); G01N 21/94 (2006.01);
U.S. Cl.
CPC ...
B07C 5/368 (2013.01); B07C 5/342 (2013.01); G01N 21/314 (2013.01); G01N 21/85 (2013.01); G01N 33/025 (2013.01); G01N 21/359 (2013.01); G01N 21/94 (2013.01); G01N 2021/8592 (2013.01); G01N 2201/0618 (2013.01); Y10S 209/939 (2013.01);
Abstract

A method of and apparatus for sorting foreign matter from a flow, the method comprising the steps of: identifying objects within a flow; for each identified object, determining reflectance intensities at at least two different wavelengths or ranges of wavelengths; and for each identified object, comparing the reflectance intensities at the at least two different wavelengths or ranges of wavelengths to a reference intensity profile, wherein the identified object is characterized as foreign matter when the reflectance intensities at the at least two different wavelengths or ranges of wavelengths fall within a predetermined region of the reference intensity profile.


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