The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Nov. 21, 2012
Applicant:

Sequenom, Inc., San Diego, CA (US);

Inventors:

Xian-Wei Yao, San Diego, CA (US);

Chao Lin, San Diego, CA (US);

Paul Heaney, Solana Beach, CA (US);

Thomas Becker, La Jolla, CA (US);

Aaron A. Hanson, San Diego, CA (US);

Michael C. Willis, La Jolla, CA (US);

Assignee:

Agena BioScience, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/02 (2006.01); C40B 60/14 (2006.01); G01N 1/10 (2006.01); B01J 19/00 (2006.01); B82Y 30/00 (2011.01); G01N 35/10 (2006.01); C40B 40/06 (2006.01); C40B 40/10 (2006.01); G01N 35/00 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
G01N 1/10 (2013.01); B01J 19/0046 (2013.01); B01L 3/0244 (2013.01); B01L 3/0248 (2013.01); B82Y 30/00 (2013.01); G01N 35/10 (2013.01); G01N 35/1016 (2013.01); B01J 2219/00387 (2013.01); B01J 2219/00527 (2013.01); B01J 2219/00585 (2013.01); B01J 2219/0059 (2013.01); B01J 2219/00596 (2013.01); B01J 2219/00605 (2013.01); B01J 2219/00612 (2013.01); B01J 2219/00619 (2013.01); B01J 2219/00659 (2013.01); B01J 2219/00677 (2013.01); B01J 2219/00686 (2013.01); B01J 2219/00689 (2013.01); B01J 2219/00691 (2013.01); B01J 2219/00722 (2013.01); B01J 2219/00725 (2013.01); B01L 2200/0657 (2013.01); C40B 40/06 (2013.01); C40B 40/10 (2013.01); C40B 60/14 (2013.01); G01N 35/0099 (2013.01); G01N 35/028 (2013.01); G01N 35/1065 (2013.01); G01N 2035/00158 (2013.01); G01N 2035/1037 (2013.01);
Abstract

A slotted pin tool, a delivery system containing the pin tool, a substrate for use in the system and methods using the pin tool and system are provided. The slotted pin tool contains a plurality of pins having slotted ends designed to fit around each loci of material deposited on a surface, such as a microarray, without contacting any of the deposited material. Sample is delivered by contacting the pin tool with the surface; the amount delivered is proportional to the velocity of the pin tool as it contacts the surface or the velocity of the liquid when movement of the pin is halted.


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