The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Mar. 02, 2011
Applicants:

Takao Yokoyama, Tokyo, JP;

Reiko Machida, Takasaki, JP;

Yayoi Irie, Takasaki, JP;

Yoshihiko Umegae, Takasaki, JP;

Inventors:

Takao Yokoyama, Tokyo, JP;

Reiko Machida, Takasaki, JP;

Yayoi Irie, Takasaki, JP;

Yoshihiko Umegae, Takasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/26 (2006.01); G01N 27/327 (2006.01); B01L 3/00 (2006.01); G01N 21/78 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 27/3272 (2013.01); B01L 3/502715 (2013.01); B01L 3/502738 (2013.01); G01N 21/78 (2013.01); B01L 2200/027 (2013.01); B01L 2300/0645 (2013.01); B01L 2300/0825 (2013.01); B01L 2400/0406 (2013.01); B01L 2400/0475 (2013.01); B01L 2400/065 (2013.01); G01N 35/1016 (2013.01);
Abstract

A detection device that is used to detect a sample includes: a base component having on its surface a sample supply position to which the sample is supplied; an electrode system formed at a distance from the sample supply position on the surface of the base component; a sliding component having a slide body that performs a sliding movement over the surface of the base component, a sample receptacle portion provided in a portion of the slide body; and a supporting portion that is fixed to the base component and supports the sliding component such that it can perform the sliding movement relative to the base component. The base and the sliding components can perform the sliding movement within a range that includes an overlap position, where the sample receptacle portion overlaps with the electrode system, and the sample supply position.


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