The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
May. 29, 2013
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Hiroshi Kusumoto, Kokubunji, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/02 (2006.01); A61B 3/10 (2006.01); G01B 11/26 (2006.01);
U.S. Cl.
CPC ...
A61B 3/1025 (2013.01); A61B 3/14 (2013.01); G01B 11/26 (2013.01);
Abstract
A measurement apparatus for measuring aberration based on return light of measuring light radiated to an object, includes a light source configured to emit the measuring light, a focusing unit configured to focus the measuring light on the object, an acquisition unit configured to acquire, from a storage unit, information indicating a state of the focusing unit corresponding to identification information of a specific object, and a control unit configured to control the focusing unit based on the acquired information indicating the state of the focusing unit.