The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Feb. 09, 2012
Applicants:
Lihong Wang, Creve Coeur, MO (US);
Liang Song, Shenzhen, CN;
Konstantin Maslov, St. Louis, MO (US);
Bin Rao, Saint Louis, MO (US);
Inventors:
Lihong Wang, Creve Coeur, MO (US);
Liang Song, Shenzhen, CN;
Konstantin Maslov, St. Louis, MO (US);
Bin Rao, Saint Louis, MO (US);
Assignee:
Washington University, St. Louis, MO (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/24 (2006.01); G02F 1/29 (2006.01); G02F 1/33 (2006.01); G02B 26/10 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G02B 26/105 (2013.01); A61B 5/42 (2013.01); A61B 5/0095 (2013.01); A61B 5/4064 (2013.01); A61B 5/441 (2013.01);
Abstract
A probe for use with an imaging system, including a scanning device configured to receive a first light beam from a light source, a beam-divider configured to split the first light beam into a plurality of second light beams, and a focusing device configured to focus each of the second light beams on respective locations in an object of interest.