The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Dec. 11, 2009
Martin Urban, Lorrach, DE;
Serguej Lopatin, Lorrach, DE;
Helmut Pfeiffer, Steinen, DE;
Endress + Hauser GmbH + Co. KG, Maulburg, DE;
Abstract
An apparatus for determining and/or monitoring at least one process variable of a medium. The apparatus includes: at least one mechanically oscillatable unit, which comes in contact at least partially with the medium; at least one transducer unit, which excites the mechanically oscillatable unit to execute mechanical oscillations and which receives mechanical oscillations from the mechanically oscillatable unit; and at least one housing. At least one limiting element is provided. The limiting element is embodied and arranged in such a manner that the limiting element at least partially surrounds the mechanically oscillatable unit and the therefrom resulting reduction of volume surrounding the mechanically oscillatable unit increases the measuring sensitivity of the apparatus. Furthermore, the invention relates to a limiting element.