The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2015
Filed:
May. 23, 2014
National Institute of Standards and Technology, Gaithersbrug, MD (US);
Vladimir Aksyuk, Gaithersburg, MD (US);
Kartik Srinivasan, Silver Spring, MD (US);
Houxun Miao, Bethesda, MD (US);
Ivo W. Rangelow, Baunatal, DE;
Thomas Michels, Dortmund, DE;
National Institute of Standards and Technology, Gaithersburg, MD (US);
University of Maryland, College Park, College Park, MD (US);
Abstract
A microscope probe includes a substrate; an optical resonator disposed on the substrate and including an optical resonance property; a displacement member disposed on the substrate and separated from the optical resonator, the displacement member including: a first end disposed distal to the optical resonator; and a second end disposed proximate to the optical resonator; and a coupling member disposed on the substrate and connecting the displacement member to the substrate, wherein the first end is configured to probe a sample and to be displaced in response to a condition of the sample, the displacement member is configured to communicate displacement of the first end to the second end, and the second end is configured to change the optical resonance property in response to displacement of the second end.