The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Feb. 11, 2005
Applicant:

Takuki Kamiya, Palo Alto, CA (US);

Inventor:

Takuki Kamiya, Palo Alto, CA (US);

Assignee:

Fujitsu Limited, Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 17/27 (2006.01); G06F 17/22 (2006.01);
U.S. Cl.
CPC ...
G06F 17/2725 (2013.01); G06F 17/2247 (2013.01);
Abstract

A method of parsing a markup-language document includes detecting, in a markup-language document, a start of a first data node of a first node type and identifying a first data definition associated with the first node type. The first data definition specifies defined contents of the first node type. The method further includes adding a first entry associated with the first data node to a data structure and reading, from the markup-language document, contents of the first data node. The method also includes determining a status of the first data node based on the first data definition and the contents read from the first data node and indicating the status of the first data node on a graphical user interface.


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