The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Oct. 24, 2012
Applicant:

Lsi Corporation, Milpitas, CA (US);

Inventors:

Fan Zhang, Milpitas, CA (US);

Weijun Tan, Longmont, CO (US);

Shaohua Yang, San Jose, CA (US);

Assignee:

LSI Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/08 (2006.01); H03M 13/29 (2006.01); H03M 13/37 (2006.01); H03M 13/00 (2006.01); H03M 13/11 (2006.01); H03M 13/41 (2006.01);
U.S. Cl.
CPC ...
G06F 11/08 (2013.01); H03M 13/1111 (2013.01); H03M 13/2957 (2013.01); H03M 13/3723 (2013.01); H03M 13/4138 (2013.01); H03M 13/6337 (2013.01); H03M 13/6343 (2013.01); H03M 13/658 (2013.01);
Abstract

Various systems and methods for media defect detection.


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