The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Aug. 02, 2013
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Teruyuki Matsuoka, Yokohama, JP;

Yukio Ishikawa, Yokohama, JP;

Tsuyoshi Ukyou, Yokohama, JP;

Fuying Yang, Kawasaki, JP;

Toshihiko Kitazume, Kawasaki, JP;

Assignee:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/15 (2006.01); G06F 11/08 (2006.01);
U.S. Cl.
CPC ...
H03M 13/151 (2013.01); G06F 11/08 (2013.01);
Abstract

According to one embodiment, an error correction device includes a syndrome processing unit, a generation unit, and a search processing unit. The syndrome processing unit generates a syndrome value based on received data. The generation unit generates t (t is a maximum number of correctable bits) coefficient values of an error position polynomial based on the syndrome value. The search processing unit calculates a root of the error position polynomial, with a concurrency of computation being equal to or greater than '2', by using the coefficient values of the error position polynomial, when a number of error bits is not more than a predetermined value s (1<=s<t). The search processing unit calculates the root of the error position polynomial, with a concurrency of computation being '1', when the number of error bits exceeds the predetermined value s.


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