The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Apr. 16, 2013
Applicant:

Copperegg Corporation, Austin, TX (US);

Inventors:

Eric Paul Anderson, Pflugerville, TX (US);

Scott Conrad Johnson, Austin, TX (US);

David Perdue, Austin, TX (US);

Luke Ehresman, Holly Springs, NC (US);

Robert B. Gordon, Austin, TX (US);

Assignee:

CopperEgg Corporation, Pflugerville, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01); G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
H04L 12/2668 (2013.01); G06F 11/3006 (2013.01); G06F 11/301 (2013.01); G06F 11/3082 (2013.01); G06F 11/3089 (2013.01); G06F 11/3495 (2013.01); G06F 11/3419 (2013.01); G06F 11/3452 (2013.01); G06F 2201/81 (2013.01); G06F 11/3409 (2013.01); G06F 11/3442 (2013.01); G06F 2201/815 (2013.01);
Abstract

Provided is a computing-system monitor configured to monitor a plurality of computing-systems each having a plurality of monitored computing-instances. The computing-system monitor may include a plurality of collectors, each collector executed by one of a plurality of monitored computing-instances, wherein the plurality of monitored computing-instances each are part of one of a plurality of separately monitored computing systems, and wherein each of the collectors is operable to output metrics of a corresponding monitored computing-instance executing that collector. The computing-system monitor may also include an analytics platform, the analytics platform having a plurality of analytic computing-instances, the analytics platform being operable to receive metrics output by the plurality of collectors, calculate statistics with the analytic computing-instances based on the received metrics, and output the calculated statistics.


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