The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Sep. 11, 2012
Applicants:

Wen-tau Yih, Redmond, WA (US);

Christopher A. Meek, Kirkland, WA (US);

Inventors:

Wen-tau Yih, Redmond, WA (US);

Christopher A. Meek, Kirkland, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01); G06Q 30/02 (2012.01);
U.S. Cl.
CPC ...
G06F 17/30687 (2013.01); G06Q 30/02 (2013.01);
Abstract

Two methods for measuring keyword-document relevance are described. The methods receive a keyword and a document as input and output a probability value for the keyword. The first method is a similarity-based approach which uses techniques for measuring similarity between two short-text segments to measure relevance between the keyword and the document. The second method is a regression-based approach based on an assumption that if an out-of-document phrase (the keyword) is semantically similar to an in-document phrase, then relevance scores of the in and out-of document phrases should be close to each other.


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