The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Aug. 06, 2012
Applicants:

Jens Lemcke, Karlsruhe, DE;

Andreas Friesen, Steinfeld, DE;

Bernhard Thimmel, Edingen-Neckarhausen, DE;

Piergiorgio Bertoli, Civezzano, IT;

Marco Pistore, Trento, IT;

Otfried Von Geisau, Sinsheim, DE;

Inventors:

Jens Lemcke, Karlsruhe, DE;

Andreas Friesen, Steinfeld, DE;

Bernhard Thimmel, Edingen-Neckarhausen, DE;

Piergiorgio Bertoli, Civezzano, IT;

Marco Pistore, Trento, IT;

Otfried von Geisau, Sinsheim, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06Q 10/06 (2012.01); G06Q 30/04 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/067 (2013.01); G06Q 30/04 (2013.01);
Abstract

Methods, systems, and computer-readable storage media for evaluating a validity of an extended status and action management (SAM) schema. In some implementations, actions include receiving the extended SAM schema, the extended SAM schema being stored as a computer-readable document in memory and being an extension of a core SAM schema, providing one or more goals, each goal representing an intention of the core SAM schema, the one or more goals being provided in a computer-readable document stored in memory and comprising one or more primary goals that each express an intention of a process underlying the core SAM schema, and processing the one or more goals using a computer-executable model checking tool for evaluating the validity of the extended SAM schema.


Find Patent Forward Citations

Loading…