The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Dec. 23, 2009
Applicants:

Heping Shang, Walnut Creek, CA (US);

Mingchen Lo, Fremont, CA (US);

Inventors:

Heping Shang, Walnut Creek, CA (US);

Mingchen Lo, Fremont, CA (US);

Assignee:

Sybase, Inc., Dublin, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2094 (2013.01); G06F 17/30575 (2013.01); G06F 11/2097 (2013.01); G06F 2201/80 (2013.01); G06F 2201/82 (2013.01);
Abstract

System, method, computer program product embodiments and combinations and sub-combinations thereof for data replication in a database system environment are described. In an aspect, the data replication includes grouping, in-memory, a plurality of transactions to be replicated as a single transaction from a source database system to a target database system. A plurality of net row changes is compiled for the plurality of transactions, and data inconsistency detection and resolution within a command application order are performed. Further included is bulk application of the plurality of net row changes to the target database system.


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