The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Jun. 10, 2011
Applicants:

Daniel Carl Mueller, Eindhoven, NL;

Dirk Leo Joep Vossen, Eindhoven, NL;

Bas Hulsken, Nijmegen, NL;

Inventors:

Daniel Carl Mueller, Eindhoven, NL;

Dirk Leo Joep Vossen, Eindhoven, NL;

Bas Hulsken, Nijmegen, NL;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06K 9/00 (2006.01); G06T 3/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0014 (2013.01); G06T 3/0068 (2013.01); G06T 2200/24 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/20104 (2013.01);
Abstract

The invention pertains to the field of image processing in digital pathology. It notably proposes a method for processing a first digital image, representing a sample in a region, and which image has been acquired from the sample by means of a microscopic imaging system () and is stored in a multi-resolution image data structure (), comprising the steps of:—retrieving () a sub-region of the first digital image at a first resolution, —executing () a transform function on the retrieved sub-region, the transform function modifying a content of the sub-region according to at least one metric derived from a second resolution representation of the first digital image.


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