The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Feb. 18, 2013
Applicant:

Wisconsin Alumni Research Foundation, Madison, WI (US);

Inventors:

Diego Hernando, Madison, WI (US);

Scott B. Reeder, Middleton, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/003 (2013.01);
Abstract

A method for producing parametric maps using a magnetic resonance imaging (MRI) system is provided. The MRI system is used to acquire k-space data from a field-of-view. A series of images is reconstructed from the acquired k-space data, and a confidence map is produced using the k-space data. The confidence map depicts regions in the field-of-view that are affected by error sources. A parametric map is produced using the reconstructed series of images and the produced confidence map. Values in the parametric map associated with regions in the field-of-view depicted in the confidence map as being affected by error sources are not computed, thereby reducing errors in the parametric map.


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