The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2015
Filed:
Aug. 01, 2013
Canon Kabushiki Kaisha, Tokyo, JP;
Kimiaki Yamaguchi, Tokyo, JP;
Toru Den, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A specimen information acquisition system is provided with a first grating which divides divergent X-rays from an X-ray source to form a plurality of primary X-ray beams, and a second grating which blocks at least a part of each of the primary X-ray beams to form a plurality of secondary X-ray beams. The specimen information acquisition system is further provided with an X-ray detector which detects the secondary X-ray beams and a calculator which calculates information of a specimen arranged between the X-ray source and the X-ray detector. The primary X-ray beams do not overlap each other on each of X-ray transmitting portions of the second grating. The edges of the respective primary X-ray beams enter a plurality of X-ray blocking portions of the second grating.