The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2015
Filed:
Aug. 02, 2012
Lei Zhu, Roswell, GA (US);
Tianye Niu, Atlanta, GA (US);
Lei Zhu, Roswell, GA (US);
Tianye Niu, Atlanta, GA (US);
Georgia Tech Research Corporation, Atlanta, GA (US);
Abstract
Briefly described, in an exemplary form, the present invention discloses a system, method and apparatus for X-ray Compton scatter imaging. In one exemplary embodiment, the present invention uses two detectors in a volumetric CT system. A first detector is positioned generally in-line with the angle of attack of the incoming energy, or, generally in-line of path x, where x is the path of the incoming energy. The first, or primary, detector detects various forms of radiation emanating from an object undergoing testing. In some embodiments, the present invention further comprises a Compton scattering system positioned generally normal to path x. In some embodiments, the Compton scattering subsystem comprises a second detector and a pin-hole collimator. The second detector detects Compton scattering energy from the object being tested.