The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2015
Filed:
Dec. 29, 2010
Issam Toufik, Juan les Pins, FR;
Fabrizio Tomatis, Saint Laurent du Var, FR;
Issam Toufik, Juan les Pins, FR;
Fabrizio Tomatis, Saint Laurent du Var, FR;
St-Ericsson SA, Plan-les-Ouates, CH;
Abstract
A method for testing a band allocated to a non serving cell for a wireless OFDM communication systems, involving the step of:—configuring the RF front end circuit to receive a wide band signal covering multiple candidates of bandwidths (BW) which are likely to be allocated to said non serving cell;—computing the received OFDM symbols;—entering into a first loop for successively testing two consecutive bandwidth candidates (BWj), said testing comprising the steps of:—computing a first non coherent power estimation (RSRP_Excessi) of the received signal on the basis of the reference signals (RS) existing in the non overlapping range of said two consecutive bandwidth (BWi);—computing a second coherent power estimation (RSRP_ExcesSj_coh)of the received signal on the basis of the reference signals (RS) existing in the non overlapping range of said two consecutive bandwidth (BWi);—comparing said first and said second estimation and determining and determining whether the tested bandwidth (BWi) is allocated to said tested non serving cell.