The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2015
Filed:
Aug. 15, 2011
Applicants:
Han-lung Huang, Hsinchu, TW;
Ming-hung Chou, Hsinchu, TW;
Inventors:
Han-Lung Huang, Hsinchu, TW;
Ming-Hung Chou, Hsinchu, TW;
Assignee:
Skymedi Corporation, Hsinchu, TW;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01); G11C 7/00 (2006.01); G11C 16/10 (2006.01); G11C 29/44 (2006.01); G11C 29/50 (2006.01); G11C 11/56 (2006.01); G11C 16/34 (2006.01); G11C 16/00 (2006.01);
U.S. Cl.
CPC ...
G11C 16/10 (2013.01); G11C 29/44 (2013.01); G11C 29/50004 (2013.01); G11C 11/5621 (2013.01); G11C 16/3418 (2013.01); G11C 16/349 (2013.01); G11C 11/5628 (2013.01); G11C 16/00 (2013.01); G11C 2211/5641 (2013.01);
Abstract
A method of sorting a multi-bit per cell non-volatile memory includes programming and reading to test an n-bit-per-cell (n-bpc) non-volatile memory, which has a plurality of m-bpc pages, where m is a positive integer from 1 through n. If the m-bpc page fails the test, counting a block associated with the failed m-bpc page to (m-1)-bpc blocks, wherein each said m-bpc page is subjected to at most one time of programming and reading. When m is equal to 1, the 0-bpc block corresponds to a bad block.