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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8994945 B1

PDFFull Text
Date of Patent:
Mar. 31, 2015

Filed:

Oct. 26, 2012

Method of treatment analysis with particle imaging

Applicant:

Fluid Imaging Technologies, Inc., Yarmouth, ME (US);

Inventors:

Matthew Duplisea, Gorham, ME (US);

Corie Drake, Portland, ME (US);

Mason Ide, Gorham, ME (US);

Assignee:

Fluid Imaging Technologies, Inc., Scarborough, ME (US);

Attorneys:

Caseiro Burke LLC

Chris A. Caseiro

Primary Examiner:

Abdullahi Nur

Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01N 21/27 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/27 (2013.01); G01N 2015/1465 (2013.01); G01N 2015/1493 (2013.01); G01N 2015/1497 (2013.01); G01N 15/1463 (2013.01);
Abstract

A method for determining the effectiveness of the treatment of a fluid for the purpose of reducing or eliminating particles in the fluid. The method includes the steps of obtaining samples of the fluid before and after treatment, delivering the samples to a particle imaging system, obtaining image information of particles in the samples, including particle colors, and comparing the difference in particle color from the first sample to the second sample. A change in particle color detected is indicative of particle death.

Find Patent Forward Citations

Duplisea, Matthew. (2015). Method of treatment analysis with particle imaging (U.S. Patent No. 8994945). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8994945

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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