The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2015
Filed:
Aug. 05, 2011
Suguru Dowaki, Kanagawa, JP;
Shingo Imanishi, Kanagawa, JP;
Gakuji Hashimoto, Kanagawa, JP;
Shunpei Suzuki, Shizuoka, JP;
Suguru Dowaki, Kanagawa, JP;
Shingo Imanishi, Kanagawa, JP;
Gakuji Hashimoto, Kanagawa, JP;
Shunpei Suzuki, Shizuoka, JP;
Sony Corporation, Tokyo, JP;
Abstract
Disclosed is a fine particle measurement apparatus including a light condensing unit that condenses irradiated light irradiated to a sample flow where fine particles pass through and directly propagates the light without scattering, and scattered light scattered by the fine particles to an optical receiver divided into a plurality of regions; a position controller that controls the relative positions of members of an optical path; and a control unit that detects positions of condensing spots of the irradiated light and the scattered light based on signal intensities of each region of the optical receiver, and controls the position controller such that the positions of the condensing spots of the irradiated light and the scattered light match with each other.