The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Jul. 27, 2012
Applicants:

Suguru Sekiya, Osaka, JP;

Woobum Kang, Osaka, JP;

Masahiro Inomata, Osaka, JP;

Inventors:

Suguru Sekiya, Osaka, JP;

Woobum Kang, Osaka, JP;

Masahiro Inomata, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/253 (2006.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/26 (2013.01); G02B 21/365 (2013.01);
Abstract

Provided is a magnification observation device capable of easily moving an observation object in a desired direction even when a stage is rotated, and capable of preventing a desired region of the observation object from going outside an imaging region due to rotation of the stage. The observation object is placed on the placement surface of the stage. The observation object is imaged by an imaging unit, to acquire image data of the imaging region. Based on the image data acquired by the imaging unit, an image of the observation object is displayed by the display part as an observed image. The stage is moved relatively with respect to the imaging unit along an x-axis and a y-axis. In this case, moving amounts along the x-axis and the y-axis are controlled based on a rotational angle detected by a rotational angle detecting part.


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