The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Jul. 01, 2010
Applicants:

Mitsuhiro Nakano, Tokyo, JP;

Tatsuo Nakata, Tokyo, JP;

Inventors:

Mitsuhiro Nakano, Tokyo, JP;

Tatsuo Nakata, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01);
Abstract

A microscope apparatus organizes and stores a plurality of types of image information acquired by a plurality of image acquisition methods at different timings. The microscope apparatus includes a time counting unit for counting time, a plurality of different image acquisition units, and a storage unit for storing image information, when acquired by any one of the image acquisition units, and timing information counted by the time counting unit, by having them associated with each other. Even if the image acquisition units acquire different types of image information at different timings, the timing information can be used to call up the image information stored in the storage unit in a chronological order.


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