The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Aug. 21, 2012
Applicants:

Jun Imamura, Kanagawa, JP;

Tsutomu Kawase, Kanagawa, JP;

Inventors:

Jun Imamura, Kanagawa, JP;

Tsutomu Kawase, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01); G06K 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 7/0095 (2013.01);
Abstract

An RFID evaluation system which evaluates an RFID system is disclosed, the RFID evaluation system including a tag position and posture varying unit which accepts a manual operation from an operator to vary a position of an RFID tag and automatically varies a posture of the RFID tag; an antenna unit which transmits a radio signal for testing to the RFID tag and which receives the radio signal transmitted from the RFID tag; and a control unit which, for each combination of the position and the posture of the RFID tag, controls the antenna unit to measure a response radio wave strength of the RFID tag, wherein the control unit includes a position measuring unit which measures the position of the RFID tag; and an information providing unit which provides information for moving the RFID tag to a target position.


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