The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Mar. 11, 2013
Applicant:

Mediatek Singapore Pte. Ltd., Singapore, SG;

Inventors:

Wen-Chang Lee, Taipei, TW;

Shih-Chi Shen, New Taipei, TW;

Chii-Horng Chen, Taichung, TW;

Xiaochuan Guo, Austin, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03B 5/08 (2006.01); H03L 7/095 (2006.01); H03L 7/093 (2006.01); H03L 7/099 (2006.01); H03B 1/00 (2006.01); H03L 7/197 (2006.01);
U.S. Cl.
CPC ...
H03L 7/095 (2013.01); H03B 1/00 (2013.01); H03L 7/093 (2013.01); H03L 7/099 (2013.01); H03L 7/1976 (2013.01); H03L 2207/50 (2013.01);
Abstract

A digitally-controlled oscillator (DCO) includes a first capacitor array and a second capacitor array responsive to an integer part and a fractional part of a digital control word, respectively. The mismatch measurement of the DCO includes a first settling phase and a second settling phase. In the first settling phase, the first capacitor array is fixed to have one capacitive value, and the second capacitor array is adjusted for making the DCO frequency locked to a target value. In the second settling phase, the first capacitor array is fixed to have another capacitive value, and the second capacitor array is adjusted for making the DCO frequency locked to the same target value. The capacitor mismatches are estimated according to characteristic values derived from the digital control word adaptively adjusted in the first setting phase and the second setting phase.


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Lee, Wen-Chang. (2015). Method and apparatus for measuring/compensating mismatches in digitally-controlled oscillator (U.S. Patent No. 8994467). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8994467

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