The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2015
Filed:
Nov. 15, 2011
Byron Harry Gibbs, McKinney, TX (US);
Bruce Randall Sult, Allen, TX (US);
Byron Harry Gibbs, McKinney, TX (US);
Bruce Randall Sult, Allen, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method of testing a packaged semiconductor device under test (DUT) including a leadframe having a plurality of pins and at least one thermal pad with a semiconductor die having topside bond pads wire-bonded by bond wires to the plurality of pins and secured to the thermal pad. A leadframe sheet is provided including a plurality of packaged DUTs including support members that connect to the packaged DUTs. The thermal pads are shorted to one another, and the leadframe sheet is trimmed for electrically isolating the pins from one another. A first electrical contact is provided to the thermal pad. Active pins of the plurality of pins are electrically contacted with a contactor. Automatic testing identifies shorts between the active pins and the thermal pad.