The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2015
Filed:
Mar. 02, 2010
Ludovic Fourneaud, Grenoble, FR;
Laurent Dussopt, Grenoble, FR;
Ludovic Fourneaud, Grenoble, FR;
Laurent Dussopt, Grenoble, FR;
Abstract
The invention relates to a method for measuring the permittivity and/or perviousness of a sample of a nonconductive material, said method comprising: a) measuring a value representative of an admittance Y, b) measuring a value representative of an admittance Yonly from the amplitude and the phase of the electromagnetic waves reflected onto an interface between the sample and the end of a second waveguide having at least one conductive web separated from a conductive sheath by a layer of dielectric material, said second waveguide also including a short circuit between the central web and the sheath at the interface with the sample, and c) calculating the permittivity of the sample from the values representative of the admittances Yand Yand/or calculating the perviousness of the sample from the values representative of the admittances Yand Y.