The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Dec. 21, 2011
Applicants:

Michael S. Larsen, Woodland Hills, CA (US);

Robert Griffith, Newhall, CA (US);

Michael D. Bulatowicz, Canoga Park, CA (US);

Philip R. Clark, Tarzana, CA (US);

Inventors:

Michael S. Larsen, Woodland Hills, CA (US);

Robert Griffith, Newhall, CA (US);

Michael D. Bulatowicz, Canoga Park, CA (US);

Philip R. Clark, Tarzana, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/00 (2006.01); G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0041 (2013.01); G01R 33/1284 (2013.01);
Abstract

One embodiment of the invention includes an atomic sensing system. The system includes an atomic sensing device configured to generate an output signal along an output axis in response to a plurality of control parameters. The system also includes a signal generator configured to apply a reference signal to a cross-axis that is approximately orthogonal to the output axis. The system also includes a phase measurement system configured to demodulate the output signal relative to the reference signal to measure a relative phase alignment between the output axis and a physical axis of the atomic sensing device based on the reference signal.


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