The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Jun. 14, 2012
Applicants:

Farhad Taghibakhsh, Redwood City, CA (US);

Craig Steven Levin, Palo Alto, CA (US);

Inventors:

Farhad Taghibakhsh, Redwood City, CA (US);

Craig Steven Levin, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/164 (2006.01); G01T 1/20 (2006.01); G01T 1/29 (2006.01); G01T 1/17 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2985 (2013.01); G01T 1/17 (2013.01);
Abstract

A method for extracting photon depth of interaction information in a positron emission tomography system is provided. A pulse is detected in a photodetector. A height of the pulse is measured. A determination of whether the pulse height is within a set range is made. Photon depth of interaction is extracted from the pulse height. An energy of interaction is calculated from the pulse height and calibration data. The extracted photon depth and calculated energy spectrum are used in image reconstruction.


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