The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2015
Filed:
Feb. 01, 2011
Yoichi Kawada, Hamamatsu, JP;
Takashi Yasuda, Hamamatsu, JP;
Hironori Takahashi, Hamamatsu, JP;
Toru Matsumoto, Hamamatsu, JP;
Yoichi Kawada, Hamamatsu, JP;
Takashi Yasuda, Hamamatsu, JP;
Hironori Takahashi, Hamamatsu, JP;
Toru Matsumoto, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
Probe light pulses output from a light source are input to an optical effect unit after the beam diameter is changed by a beam diameter changing optical system, the pulse front is tilted by a pulse front tilting unit, and the beam diameter is adjusted by a beam diameter adjusting optical system. To the optical effect unit, probe light pulses output from the beam diameter adjusting optical system are input, and an electromagnetic wave being an object to be detected is also input. Optical characteristics of the optical effect unit change due to propagation of the electromagnetic wave, and probe light pulses affected by the change in optical characteristics are output from the optical effect unit. The probe light pulses output from the optical effect unit are detected by a photodetector.