The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2015
Filed:
Mar. 21, 2014
Gii Acquisition, Llc, Davisburg, MI (US);
Nathan Andrew-Paul Kujacznski, Flint, MI (US);
Michael G. Nygaard, Fenton, MI (US);
GII Acquisition, LLC, Davisburg, MI (US);
Abstract
A high-speed, high-resolution, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts are provided. The method includes consecutively transferring the parts so that the parts move along a path which extends from a supply of parts and through an imaging station. A triangulation-based sensor head is supported at the imaging station. The sensor head is configured to generate focused lines of radiation and to sense corresponding reflected lines of radiation. The focused lines are delivered onto an end surface of each part to obtain a corresponding array of reflected lines of radiation. The sensor head senses the array of reflected lines to obtain a corresponding set of 2-D profile signals. The set of profile signals represent a 3-D view of the end surface. The set of 2-D profile signals of each part is processed to identify parts having an unacceptable defect.