The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Dec. 27, 2007
Applicants:

Keiko Sekine, Chiba, JP;

Yuichi Miyazaki, Tokyo, JP;

Satoko Maenishi, Saitama, JP;

Inventors:

Keiko Sekine, Chiba, JP;

Yuichi Miyazaki, Tokyo, JP;

Satoko Maenishi, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B 33/00 (2006.01); B32B 38/00 (2006.01); B32B 37/24 (2006.01);
U.S. Cl.
CPC ...
B32B 38/145 (2013.01); B32B 2037/243 (2013.01); B32B 2307/416 (2013.01); B32B 2310/08 (2013.01); B32B 2310/0831 (2013.01);
Abstract

An infrared ray reflection pattern-printed transparent sheet is provided which can be applied to a data input system of a type of handwriting directly on a screen of a display device and provides a coordinate detect means and which is lightweight, low in a cost, readily increased in an area, possible in mass production and excellent in a read performance. It is an infrared ray reflection pattern-printed transparent sheet in which infrared ray reflective transparent patterns are printed on a surface of a transparent substrate and which is disposed oppositely to a front face of a display device. A cross section obtained by cutting the infrared ray reflective transparent patterns printed on the above transparent substrate in a face orthogonal to the above transparent substrate is formed so that it assumes a multilayer structure comprising a fixed repeating cycle when observed under a scanning electron microscope.


Find Patent Forward Citations

Loading…