The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Jul. 02, 2013
Applicant:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Inventors:

Terry A. Beaty, Indianapolis, IN (US);

Eric R. Diebold, Fishers, IN (US);

Abner D. Joseph, Carmel, IN (US);

Randall K. Riggles, Indianapolis, IN (US);

Assignee:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01); G01N 27/07 (2006.01); G01N 27/02 (2006.01);
U.S. Cl.
CPC ...
G01N 27/02 (2013.01);
Abstract

Embodiments of the invention include a test strip with a sample chamber opening spanning the width of the test strip at the sampling end and including a portion of the lateral sides at that end. The chamber is vertically bounded by upper and lower substrate layers, horizontally bounded by the front face of a spacer layer, and open on the remaining sides. The test strip fills rapidly and requires small sample volumes. Both 1-up and 2-up manufacturing techniques for producing such test strips eliminate registration and alignment steps, and other techniques relating to the 2-up technique (simultaneously manufacturing test strips arranged in multiple columns) are also disclosed.


Find Patent Forward Citations

Loading…