The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Sep. 30, 2013
Applicant:

Quantum Design International, Inc., San Diego, CA (US);

Inventor:

Michael Bancroft Simmonds, Boseman, MT (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/56 (2006.01); G01N 25/16 (2006.01); G01N 27/22 (2006.01);
U.S. Cl.
CPC ...
G01N 25/16 (2013.01); G01N 27/226 (2013.01);
Abstract

An ultrasensitive ratiometric capacitance dilatometer and related methods are described. The dilatometer provides a capacitance measurement based on a ratiometric capacitance, or the capacitance ratio measured between two or more parallel plate capacitors of the dilatometer. In this regard, an absolute capacity bridge is not required, and even more advantageously, the effects of adsorbed gas are greatly reduced compared to conventional dilatometers. The ratiometric capacitance dilatometer provides a symmetrical configuration, which reduces the effects of temperature gradients. Moreover, certain embodiments provide a 'v-groove design', wherein a first parallel plate capacitor forms an angle with a second parallel plate capacitor of the dilatometer along a key centerline of the dilatometer cell, which improves manufacturability due to simpler grinding, metalizing and assembly.


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