The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Nov. 20, 2009
Applicants:

Sjoerd Stallinga, Eindhoven, NL;

Stefano Cattaneo, Landquart, CH;

Inventors:

Sjoerd Stallinga, Eindhoven, NL;

Stefano Cattaneo, Landquart, CH;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01N 1/22 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0625 (2013.01); G01N 1/2205 (2013.01);
Abstract

An apparatus for analyzing a fluid of volume V includes a filter having a filter surface or area A, the filter being capable of allowing the fluid to flow through the filter surface. The fluid's volumetric flow density, averaged over the filter surface, is j. The apparatus further includes a scanner for scanning the filter surface with a scan rate B. The area A is optimized based on the volume V, the scan rate B and the volumetric flow density jto minimize the sum of filtering time and scanning time. Instead of one filter, at least two filters may be used each having a different area A. The apparatus also includes a mechanism for selecting one of the filters and placing the selected filter in an operating position, where the scanner scans the filter surface face of the selected filter.


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