The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Aug. 31, 2007
Applicants:

Dimple Bhatia, San Jose, CA (US);

John F. Hornibrook, Markham, CA;

Harold Hotelling Lee, San Jose, CA (US);

Eileen Tien Lin, San Jose, CA (US);

Ivan Popivanov, Markham, CA;

Daniele Costante Zilio, Georgetown, CA;

Inventors:

Dimple Bhatia, San Jose, CA (US);

John F. Hornibrook, Markham, CA;

Harold Hotelling Lee, San Jose, CA (US);

Eileen Tien Lin, San Jose, CA (US);

Ivan Popivanov, Markham, CA;

Daniele Costante Zilio, Georgetown, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30536 (2013.01);
Abstract

A method and system for collecting statistics on database tables. In one embodiment, the method includes identifying a plurality of tables for statistics collection, wherein each table of the plurality of tables are remote tables; examining at least one attribute for each table identified for statistics collection; prioritizing the tables for statistics collection based on the at least one attribute; and collecting statistics on the identified tables in a priority sequence.


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