The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2015
Filed:
Mar. 15, 2011
Marius I. Danciu, Cluj-Napoca, RO;
Fan LI, Xi'an, CN;
Michael Mcroberts, Rochester, MN (US);
Jing-yun Shyr, Naperville, IL (US);
Damir Spisic, Chicago, IL (US);
Jing Xu, Xi'an, CN;
Marius I. Danciu, Cluj-Napoca, RO;
Fan Li, Xi'an, CN;
Michael McRoberts, Rochester, MN (US);
Jing-Yun Shyr, Naperville, IL (US);
Damir Spisic, Chicago, IL (US);
Jing Xu, Xi'an, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Techniques are disclosed for generating an ensemble model from multiple data sources. In one embodiment, the ensemble model is generated using a global validation sample, a global holdout sample and base models generated from the multiple data sources. An accuracy value may be determined for each base model, on the basis of the global validation dataset. The ensemble model may be generated from a subset of the base models, where the subset is selected on the basis of the determined accuracy values.