The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2015
Filed:
Jan. 23, 2012
Spyridon K. Lazaratos, Houston, TX (US);
KE Wang, Sugar Land, TX (US);
Spyridon K. Lazaratos, Houston, TX (US);
Ke Wang, Sugar Land, TX (US);
ExxonMobil Upstream Research Company, Houston, TX (US);
Abstract
Wavelet estimation method, particularly advantageous for full wavefield inversion ('FWI') of seismic data, that makes use of both the primary and multiple reflections in the data. The inventive method uses an FWI algorithm to generate a subsurface model from primary reflections () in a shallow layer before first arrival of multiple reflections (). The model is then used to simulate multiples (). The wavelet is subsequently modified () such that the simulated multiples closely match the true recorded multiples (). The simulated multiples may then be subtracted from the measured data () thereby creating a deeper top layer of data substantially free of multiples, and the method may then be repeated to extend the subsurface model to a greater depth ().